Buscar
Mostrando ítems 31-39 de 39
Inclination shift signal: thickness or index measurement in transparent media by transmission of generally astigmatic Gaussian beams
(2021-04)
The focus error signal is a widespread optical technique that harnesses the shape of a simply astigmatic Gaussian beam to produce an output signal with a well-defined linear range used for many different applications. ...
Fast scanner with position monitor forlargeopticaldelays
(2001-11-01)
Wepresent a new fastscansystemthatemploys a stepper motor used in a single steposcillatingmode and a position monitor devicebasedon a diode laser. Thesetupusedgeneratesdelays as large as 105 ps at 10 Hz, with 100% dutycycle. ...
Feasibility and analysis of a system of two in tandem interferometers for optical coherence tomography
(IEE Explore Digital Library, 2017-12-18)
A signal obtained from a combined system of two interferometers of low coherence in the frequency domain is presented and analyzed. This system allows to expand the range of measurement offered by the conventional optical ...
Application of a long-rangesweptsource optical coherence tomography-based scheme for dimensional characterization of multilayer transparent objects
(2017-08-18)
This work presents the use of a recently develop edinter ferometric system based on the swept source optical coherence tomography (SS-OCT) technique, which allows the characterization of transparent and semitransparent ...
Topografía de superficies obtenida por interferometría de baja coherencia de alta resolución espacial
(2016)
La tomografía óptica coherente (OCT por sus siglas en inglés) es una técnica óptica no destructiva, que utiliza una fuente de luz de gran ancho espectral que se enfoca sobre un punto de la muestra para determinar la distancia ...
Spectral sensor resolution measurement improvements by temporal analysis
(IEEE Xplore, 2017-12-18)
In this work we present time domain interferometry (TDI) and spectral domain interferometry (SDI) techniques applied to a fiber optic Fizeau interferometer sensor. This class of sensor is capable of measuring parameters ...
Wide band interferometryforthicknessmeasurement
(2003)
In thisworkwepresentthe concept of wide band interferometry
as opposed to white-light interferometry to introduce a thickness
measurementmethodthatgainsprecisionwhenthebandwidthisreduced to
anadequatecompromise in order ...
Simultaneous measurement of deformation and thickness change in polymer films
(2006-08-14)
We present experimental results in deformation measurement and thickness change in polymer films employing Fourier domain interferometry. The set-up is a Michelson configuration in which interference signal betweeen light ...
Simple method for thickness measurement in opaque samples with a Michelson-Sagnac interferometer
(2008-04-24)
We present in this work a method to measure thicknesses of opaque samples. The technique combines the use of low coherence interferometry with a Michelson-Sagnac configuration. This ring set-up let us to measure both faces ...