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Limitations due to the detector in the low coherence interferometry
(2008-02-15)
Se describirá como se generan las señales de interferometria de baja coherencia en el espacio de
Fourier, se determinara las características que determinan el rango dinámico del sistema y las
señales asociadas al sistema ...
Characterization of reference standards for dirt by Laser Ablation Induced Photoacoustics (LAIP)
(2009-07-23)
Measurements of surface cleanliness and dirt characterization are important problems in a wide range of processes in industry and production. Standard methods are in most cases cumber some laboratory procedures that must ...
Simultaneous measurement of deformation and thickness change in polymer films
(2006-08-14)
We present experimental results in deformation measurement and thickness change in polymer films employing Fourier domain interferometry. The set-up is a Michelson configuration in which interference signal betweeen light ...
Simple method for thickness measurement in opaque samples with a Michelson-Sagnac interferometer
(2008-04-24)
We present in this work a method to measure thicknesses of opaque samples. The technique combines the use of low coherence interferometry with a Michelson-Sagnac configuration. This ring set-up let us to measure both faces ...