• Wide band interferometryforthicknessmeasurement 

    Constantino, Santiago; Martínez, Oscar; Torga, Jorge Román (2003)
    In thisworkwepresentthe concept of wide band interferometry as opposed to white-light interferometry to introduce a thickness measurementmethodthatgainsprecisionwhenthebandwidthisreduced to anadequatecompromise in order ...