2025-06-252023-01-20https://hdl.handle.net/20.500.12272/13316Due to strong requirement in term of capacitance voltage linearity, MIM capacitance stability during the whole operating lifetime of the product appears to be a key issue to warrant the reliability of this device. Using a constant current stress, two effects can be noticed on the evolution of the stressed C–V characteristics: a voltage shift to negative bias and a significant increase of the capacitance. Both phenomena have been demonstrated to be strongly correlated and to have the same origin: the trapped charges in oxide, which can generate new dipoles in the dielectric and, as a result, modulate the dielectric permittivity.plaineninfo:eu-repo/semantics/openAccessSoft fault diagnosisAnalog faultsSwitched-capacitor filtersAnalog reconfigurable devicesDegradation faultsDynamic time warpinginfo:eu-repo/semantics/articleSpringerCC-BY-NC-NDhttps://doi.org/10.1007/s00034-022-02262-6