2020-07-172020-07-172003Santiago Costantino, Oscar E. Martínez, and Jorge R. Torga, "Wide band interferometryforthicknessmeasurement," Opt. Express 11, 952-957 (2003)http://hdl.handle.net/20.500.12272/4474In thisworkwepresentthe concept of wide band interferometry as opposed to white-light interferometry to introduce a thickness measurementmethodthatgainsprecisionwhenthebandwidthisreduced to anadequatecompromise in order to avoidthedistortionsarisingfromthe material dispersion. The use of thewidestpossible band is a well established dogma whenthehighestresolutionisdesired in distance measurementswithwhite-light interferometry. Wewill show thatthe dogma fallswhenthicknessmeasurementsmust be carriedoutdue to material dispersion. In factthe precise knowledge of thefrequencydependence of therefractiveindexisessentialforadequatethicknessretrievalfromthe opticalexperiments. Thedevicewepresentisalsouseful to obtainthegroup refractiveindexthatisnecessary to calculatetheabsolutethicknessvalue. As anexample, we show thespreading of a siliconeoilon a reference surface in real time.application/pdfenginfo:eu-repo/semantics/openAccesshttp://creativecommons.org/licenses/by-nc-sa/4.0/Atribución-NoComercial-CompartirIgual 4.0 InternacionalUTNFacultad Regional DeltaWide Band InterferometryWhite-light InterferometryThicknessmeasurementinfo:eu-repo/semantics/articleCostantino, SantiagoAtribución–No Comercial–Compartir Igual (by-nc-sa)10.1364/OE.11.000952