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    AuthorTorga, Jorge (3)Morel, Eneas (2)Aguilar, Andres (1)Berté, Rodrigo (1)Boggiano, Hilario D (1)Bragas, Andrea V. (1)Cerrotta, Santiago (1)Cortés, Emiliano (1)Cusato, Leslie (1)Duchowicz, Ricardo (1)... View MoreSubjectFRD (3)UTN (3)Dynamic range (1)fourier chirp algoritmo (1)Fourier transform spectroscopy (1)General astigmatism (1)Heterodyne detection (1)Index measurement (1)Low-coherence interferometry (1)low-coherence interferometry (1)... View MoreDate Issued2021 (1)2020 (3)

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    Dimensional characterization of large opaque samples and microdeformations by low coherence interferometry 

    Torga, Jorge; Morel, Eneas; Russo, Nélida A.; Duchowicz, Ricardo (2020-01-25)
    We report on the application of an interferometric system based on the low-coherence interferometry technique to the dimensional characterization of large opaque mechanical parts as well as microdeformations experienced ...
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    Determination of Nanoscale Mechanical Properties of Polymers via Plasmonic Nanoantennas 

    Boggiano, Hilario D; Berté, Rodrigo; Scarpettini, Alberto F; Cortés, Emiliano; Maier, Stefan A.; Bragas, Andrea V. (2020-06-02)
    Nanotechnology and the consequent emergence of miniaturized devices are driving the need to improve our understanding of the mechanical properties of a myriad of materials. Here we focus on amorphous polymeric materials ...
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    Inclination shift signal: thickness or index measurement in transparent media by transmission of generally astigmatic Gaussian beams 

    Aguilar, Andres; Torga, Jorge (2021-04)
    The focus error signal is a widespread optical technique that harnesses the shape of a simply astigmatic Gaussian beam to produce an output signal with a well-defined linear range used for many different applications. ...
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    Extending low-coherence interferometry dynamic range using heterodyne detection 

    Cusato, Leslie; Cerrotta, Santiago; Torga, Jorge; Morel, Eneas (2020-08)
    Low-coherence interferometry (LCI) technique is generating considerable interest in industrial applications where there is a need for larger measurements with high resolution. Conventional Fourier domain systems reach a ...

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