Listar FRD - Investigación - Ciencia y Tecnología por título
Mostrando ítems 149-149 de 149
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Wide band interferometryforthicknessmeasurement
(2003)In thisworkwepresentthe concept of wide band interferometry as opposed to white-light interferometry to introduce a thickness measurementmethodthatgainsprecisionwhenthebandwidthisreduced to anadequatecompromise in order ...