ListarGrupo de Nanofotonica por tema "Thicknessmeasurement"
Mostrando ítems 1-1 de 1
-
Wide band interferometryforthicknessmeasurement
(2003)In thisworkwepresentthe concept of wide band interferometry as opposed to white-light interferometry to introduce a thickness measurementmethodthatgainsprecisionwhenthebandwidthisreduced to anadequatecompromise in order ...