Repository logo
Communities & Collections
All of DSpace
  • English
  • العربية
  • বাংলা
  • Català
  • Čeština
  • Deutsch
  • Ελληνικά
  • Español
  • Suomi
  • Français
  • Gàidhlig
  • हिंदी
  • Magyar
  • Italiano
  • Қазақ
  • Latviešu
  • Nederlands
  • Polski
  • Português
  • Português do Brasil
  • Srpski (lat)
  • Српски
  • Svenska
  • Türkçe
  • Yкраї́нська
  • Tiếng Việt
Log In
New user? Click here to register.Have you forgotten your password?
  1. Home
  2. Browse by Author

Browsing by Author "Martínez, Oscar"

Filter results by typing the first few letters
Now showing 1 - 2 of 2
  • Results Per Page
  • Sort Options
  • Thumbnail Image
    Item
    Fast scanner with position monitor forlargeopticaldelays
    (2001-11-01) Constantino, Santiago; Martínez, Oscar; Torga, Jorge Román; Do Campo, P.; Libertiun, A.R.
    Wepresent a new fastscansystemthatemploys a stepper motor used in a single steposcillatingmode and a position monitor devicebasedon a diode laser. Thesetupusedgeneratesdelays as large as 105 ps at 10 Hz, with 100% dutycycle. Wealso introduce a reliabledevicebasedontheshadow of a movingcutterwith a laser diode as the light source to avoidpowerfluctuationsproblems.
  • Thumbnail Image
    Item
    Wide band interferometryforthicknessmeasurement
    (2003) Constantino, Santiago; Martínez, Oscar; Torga, Jorge Román
    In thisworkwepresentthe concept of wide band interferometry as opposed to white-light interferometry to introduce a thickness measurementmethodthatgainsprecisionwhenthebandwidthisreduced to anadequatecompromise in order to avoidthedistortionsarisingfromthe material dispersion. The use of thewidestpossible band is a well established dogma whenthehighestresolutionisdesired in distance measurementswithwhite-light interferometry. Wewill show thatthe dogma fallswhenthicknessmeasurementsmust be carriedoutdue to material dispersion. In factthe precise knowledge of thefrequencydependence of therefractiveindexisessentialforadequatethicknessretrievalfromthe opticalexperiments. Thedevicewepresentisalsouseful to obtainthegroup refractiveindexthatisnecessary to calculatetheabsolutethicknessvalue. As anexample, we show thespreading of a siliconeoilon a reference surface in real time.

 

UTN | Rectorado

Sarmiento 440

(C1041AAJ)

Buenos Aires, Argentina

+54 11 5371 5600

SECRETARÍAS
  • Académica
  • Administrativa
  • Asuntos Estudiantiles
  • Ciencia y Tecnología
  • Consejo Superior
  • Coordinación Universitaria
  • Cultura y Extensión Universitaria
  • Igualdad de género y Diversidad
  • Planeamiento Académico y Posgrado
  • Políticas Institucionales
  • Relaciones Internacionales
  • TIC
  • Vinculación Tecnológica
  • Comité de Seguridad de la Información
ENLACES UTN
  • DASUTeN
  • eDUTecNe
  • APUTN
  • ADUT
  • FAGDUT
  • FUT
  • SIDUT
ENLACES EXTERNOS
  • Secretaría de Educación
  • CIN
  • CONFEDI
  • CONEAU
  • Universidades