Listar Grupo de Nanofotonica por título

Mostrando ítems 48-54 de 54

  • Simultaneous measurement of deformation and thickness change in polymer films 

    Torga, Jorge Román; Morel, Eneas Nicolás (2006-08-14)
    We present experimental results in deformation measurement and thickness change in polymer films employing Fourier domain interferometry. The set-up is a Michelson configuration in which interference signal betweeen light ...

  • Síntesis de nanopartículas híbridas dieléctrico-metal y estudio de sus propiedades ópticas 

    Paredes, María; Scarpettini, Alberto (2018)
    Se sintetizaron y estudiaron nanopartículas esféricas del tipo núcleo-cáscara de sílice y oro, con control de sus dimensiones. En una primera etapa se realizó la síntesis de esferas de SiO2 monodispersas de varios tamaños, ...

  • Spectral sensor resolution measurement improvements by temporal analysis 

    Antonacci, Julian; Morel, Eneas Nicolás; Torga, Jorge Román; Duchowicz, Ricardo; Arenas, Gustavo F. (IEEE Xplore, 2017-12-18)
    In this work we present time domain interferometry (TDI) and spectral domain interferometry (SDI) techniques applied to a fiber optic Fizeau interferometer sensor. This class of sensor is capable of measuring parameters ...

  • Time Fourier domain low coherence interferometry 

    Cerrotta, Santiago; Torga, Jorge Román; Morel, Eneas Nicolás (2022-04)
    We presented a new system that combine Time Domain and Fourier Domain Low Coherence Interferometry. Moving one interferometer arm the Fourier Transform can be detected in the photodiode. Maths and experimental results are shown.

  • Topografía de superficies obtenida por interferometría de baja coherencia de alta resolución espacial 

    Sallese, Marcelo; Torga, Jorge Román; Tabla, Pablo; Morel, Eneas Nicolás (2016)
    La tomografía óptica coherente (OCT por sus siglas en inglés) es una técnica óptica no destructiva, que utiliza una fuente de luz de gran ancho espectral que se enfoca sobre un punto de la muestra para determinar la distancia ...

  • Transparent glass slab thickness measurement by binary-spot focus signal 

    Aguilar, Andrés; Torga, Jorge Román (2019-12-12)
    Focus error systems based on the astigmatic principle relying on four quadrant photo detectors as the signal generation element have widely been used in many different applications. Nevertheless, its working principle ...

  • Wide band interferometryforthicknessmeasurement 

    Constantino, Santiago; Martínez, Oscar; Torga, Jorge Román (2003)
    In thisworkwepresentthe concept of wide band interferometry as opposed to white-light interferometry to introduce a thickness measurementmethodthatgainsprecisionwhenthebandwidthisreduced to anadequatecompromise in order ...