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dc.creatorMorel, Eneas
dc.creatorRusso, Nélida A.
dc.creatorTorga, Jorge
dc.creatorDuchowicz, Ricardo
dc.date.accessioned2020-09-16T23:42:18Z
dc.date.available2020-09-16T23:42:18Z
dc.date.issued2015-12-11
dc.identifier.citationInterferometric system based on swept source-optical coherence tomography scheme applied to the measurement of distances of industrial interest.es_ES
dc.identifier.urihttp://hdl.handle.net/20.500.12272/4528
dc.description.abstractWe used an interferometric technique based on typical optical coherence tomography (OCT) schemes for measuring distances of industrial interest. The system employed as a light source a tunable erbium-doped fiber laser of ∼20-pm bandwidth with a tuning range between 1520 and 1570 nm. It has a sufficiently long coherence length to enable long depth range imaging. A set of fiber Bragg gratings was used as a self-calibration method, which has the advantage of being a passive system that requires no additional electronic devices. The proposed configuration and the coherence length of the laser enlarge the range of máximum distances that can be measured with the common OCT configuration, maintaining a good axial resolution. A measuring range slightly >17 cm was d0.etermined. The system performance was evaluated by studying the repeatability and axial resolution of the results when the same optical path difference was measured. Additionally, the thickness of a semitransparent medium was also measured.es_ES
dc.formatapplication/pdfes_ES
dc.language.isoenges_ES
dc.rightsinfo:eu-repo/semantics/openAccesses_ES
dc.rights.urihttp://creativecommons.org/licenses/by-nc-sa/4.0/*
dc.rights.uriAtribución-NoComercial-CompartirIgual 4.0 Internacional*
dc.sourceOptical Engineeringes_ES
dc.subjectUTNes_ES
dc.subjectFRDes_ES
dc.subjectOptical coherence tomographyes_ES
dc.subjectmetrological instrumentationes_ES
dc.subjectdistance measurement.es_ES
dc.titleInterferometric system based on swept source-optical coherence tomography scheme applied to the measurement of distances of industrial interestes_ES
dc.typeinfo:eu-repo/semantics/articlees_ES
dc.rights.holderMorel, Eneases_ES
dc.description.affiliationFil: Morel, Eneas. Universidad Tecnológica Nacional. Facultad Regional Delta. Grupo de Nanofotonica ; Argentina.es_ES
dc.description.affiliationFil: Torga, Jorge. Universidad Tecnológica Nacional. Facultad Regional Delta. Grupo de Nanofotonica ; Argentina.es_ES
dc.description.peerreviewedPeer Reviewedes_ES
dc.type.versioninfo:eu-repo/semantics/publishedVersiones_ES
dc.relation.referenceshttps://www.spiedigitallibrary.org/journals/Optical-Engineering/volume-55/issue-info:eu-repo/semantics/restrictedAccesses_ES
dc.rights.useAtribución – No Comercial – Compartir Igual (by-nc-sa)es_ES
dc.identifier.doi10.1117/1.OE.56.8.084102


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