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dc.creatorPrevosto, Leandro
dc.creatorKelly, Héctor
dc.creatorMinotti, Fernando
dc.date.accessioned2024-02-15T00:38:19Z
dc.date.available2024-02-15T00:38:19Z
dc.date.issued2008
dc.identifier.citationIEEE TRANSACTIONS ON PLASMA SCIENCE.es_ES
dc.identifier.urihttp://hdl.handle.net/20.500.12272/9485
dc.description.abstractA semiempirical Langmuir probe model is intro duced that is particularly adapted to high-energy-density cutting arcs, for which, as we have shown in Part I, the ion current collected by negatively biased probes shows no plateau in the ion branch of the current–voltage (I–V ) probe characteristic, and the signal amplitude is independent of the probe radius. According to the model, the ion drag due to the high-velocity plasma flow around the probe limits the effectively collecting area to a small fraction of the probe surface. If, according to the experimental evidence, this fraction is made independent of the probe radius, then its value results proportional to the probe bias, and so no plateau is found, at least as long as the collecting area is less than (half) the probe surface, which happens only at rather high probe bias. The model requires the determination of the function relating the electric field (in the region between the unperturbed plasma and the space-charge sheath close to the probe) to the parameters of the problem. Dimensional analysis together with empirical information allow to restrict the form of this function to leave only an auxiliary dimensionless function, which can be argued to be practically constant and whose value can be determined between rather tight bounds. As an example, radial profiles of plasma temperature and density are obtained by applying the proposed model to the experimental values of a I–V probe characteristic obtained in Part I. The derived temperature profile is in good agreement with a previous published numerical simulation for a similar cutting torch.es_ES
dc.formatpdfes_ES
dc.language.isoenges_ES
dc.language.isoenges_ES
dc.rightsopenAccesses_ES
dc.rights.urihttp://creativecommons.org/licenses/by-nc-nd/4.0/*
dc.rights.uriAttribution-NonCommercial-NoDerivatives 4.0 Internacional*
dc.subjectCutting arcs.es_ES
dc.subjectLangmuir probeses_ES
dc.subjectPlasma diagnostic.es_ES
dc.titleOn the Use of Sweeping Langmuir Probes in Cutting-Arc Plasmas—Part II: Interpretation of the Results.es_ES
dc.typeinfo:eu-repo/semantics/articlees_ES
dc.rights.holderPrevosto, Leandro.es_ES
dc.description.affiliationFil: Prevosto, Leandro. Universidad Tecnológica Nacional. Facultad Regional Venado Tuerto. Departamento Ingeniería Electromecánica. Grupo de Descargas Eléctricas. Santa Fe; Argentina.es_ES
dc.description.affiliationFil: Kelly, Héctor. Facultad de Ciencias Exactas y Naturales (UBA). Departamento de Física. Instituto de Física ( CONICET). Buenos Aires; Argentina.es_ES
dc.description.affiliationFil: Minotti, Fernando. Instituto de Física del Plasma. Departamento de Física. Facultad de Ciencias Exactas y Naturales. Universidad de Buenos Aires; Argentina.es_ES
dc.description.peerreviewedPeer Reviewedes_ES
dc.type.versionacceptedVersiones_ES
dc.rights.useCreative Commons http://creativecommons.org/licenses/by-nc-nd/4.0/ Attribution-NonCommercial-NoDerivatives 4.0 Internacional Este trabajo puede ser utilizado con fines académicos y de estudio. es_ES
dc.identifier.doi10.1109/TPS.2007.914182
dc.relation.isreferencedbyIEEE TRANSACTIONS ON PLASMA SCIENCE, VOL. 36, NO. 1, FEBRUARY 2008.es_ES


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