Soft Fault Diagnosis in EmbeddedSwitched-Capacitor Filters

Simple item page
dc.creatorDri, Emanuel
dc.creatorRomero, Eduardo Abel
dc.creatorPeretti, Gabriela Marta
dc.date.accessioned2025-06-25T19:14:43Z
dc.date.issued2023-01-20
dc.description.abstractDue to strong requirement in term of capacitance voltage linearity, MIM capacitance stability during the whole operating lifetime of the product appears to be a key issue to warrant the reliability of this device. Using a constant current stress, two effects can be noticed on the evolution of the stressed C–V characteristics: a voltage shift to negative bias and a significant increase of the capacitance. Both phenomena have been demonstrated to be strongly correlated and to have the same origin: the trapped charges in oxide, which can generate new dipoles in the dielectric and, as a result, modulate the dielectric permittivity.
dc.description.affiliationDri, Emanuel. Universidad Tecnológica Nacional. Facultad Regional Villa María. Argentina.
dc.description.affiliationRomero, Eduardo Abel. Universidad Tecnológica Nacional. Facultad Regional Villa María. Ingeniería Electrónica. Argentina.
dc.description.affiliationPeretti, Gabriela Marta. Universidad Tecnológica Nacional. Facultad Regional Villa María. Ingeniería Electrónica. Argentina.
dc.description.peerreviewedPeer Reviewed
dc.formatplain
dc.identifier.doihttps://doi.org/10.1007/s00034-022-02262-6
dc.identifier.urihttps://hdl.handle.net/20.500.12272/13316
dc.language.isoen
dc.publisherBirkhäuser Springer
dc.rightsinfo:eu-repo/semantics/openAccess
dc.rights.holderSpringer
dc.rights.useCC-BY-NC-ND
dc.subjectSoft fault diagnosis
dc.subjectAnalog faults
dc.subjectSwitched-capacitor filters
dc.subjectAnalog reconfigurable devices
dc.subjectDegradation faults
dc.subjectDynamic time warping
dc.titleSoft Fault Diagnosis in EmbeddedSwitched-Capacitor Filters
dc.typeinfo:eu-repo/semantics/article
dc.type.versionpublisherVersion

Files

Original bundle

Now showing 1 - 1 of 1
No Thumbnail Available
Name:
90[1].jpg
Size:
6.02 KB
Format:
Joint Photographic Experts Group/JPEG File Interchange Format (JFIF)
Download

License bundle

Now showing 1 - 1 of 1
No Thumbnail Available
Name:
license.txt
Size:
3.63 KB
Format:
Item-specific license agreed upon to submission
Description:
Download

Collections

FRVM – Proyectos de Investigación y Desarrollo - Artículos