FRVM – Proyectos de Investigación y Desarrollo

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Subject: search.filters.subject.Dynamic time warping

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    A fast soft-fault diagnosis procedure using a first nearest neighbor classification
    (IEEE, 2022-09-07) Dri, Emanuel; Peretti, Gabriela Marta; Romero, Eduardo Abel
    This article proposes a fault diagnosis scheme for second-order switched-capacitor filters embedded in the Infineon PSoC1 reconfigurable microcontroller. The faults considered are single soft faults that diminish the capacitance of the capacitors. Specifically, the scheme focuses on incipient faults, which are the hardest to identify because they produce a small impact on the circuit’s performance. The scheme estimates the value of the degradation of the capacitors by employing a first nearest neighbor (1NN) classifier. Our proposal compares the output test patterns against a dictionary of selected fault patterns (one for each capacitor) using Dynamic Time Warping (DTW) distance measures. The easiness of construction of this dictionary and the conceptual simplicity of the method are the most relevant features of the proposal. The characterization of the scheme is made with MatLab simulations at a transfer-function level to limit the computational cost. The simulation results show that the diagnosis procedure can determine the capacitor that presents incipient faults.
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    Soft Fault Diagnosis in EmbeddedSwitched-Capacitor Filters
    (Birkhäuser Springer, 2023-01-20) Dri, Emanuel; Romero, Eduardo Abel; Peretti, Gabriela Marta
    Due to strong requirement in term of capacitance voltage linearity, MIM capacitance stability during the whole operating lifetime of the product appears to be a key issue to warrant the reliability of this device. Using a constant current stress, two effects can be noticed on the evolution of the stressed C–V characteristics: a voltage shift to negative bias and a significant increase of the capacitance. Both phenomena have been demonstrated to be strongly correlated and to have the same origin: the trapped charges in oxide, which can generate new dipoles in the dielectric and, as a result, modulate the dielectric permittivity.