Wide band interferometryforthicknessmeasurement

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dc.creatorConstantino, Santiago
dc.creatorMartínez, Oscar
dc.creatorTorga, Jorge Román
dc.date.accessioned2020-07-17T03:25:38Z
dc.date.available2020-07-17T03:25:38Z
dc.date.issued2003
dc.description.abstractIn thisworkwepresentthe concept of wide band interferometry as opposed to white-light interferometry to introduce a thickness measurementmethodthatgainsprecisionwhenthebandwidthisreduced to anadequatecompromise in order to avoidthedistortionsarisingfromthe material dispersion. The use of thewidestpossible band is a well established dogma whenthehighestresolutionisdesired in distance measurementswithwhite-light interferometry. Wewill show thatthe dogma fallswhenthicknessmeasurementsmust be carriedoutdue to material dispersion. In factthe precise knowledge of thefrequencydependence of therefractiveindexisessentialforadequatethicknessretrievalfromthe opticalexperiments. Thedevicewepresentisalsouseful to obtainthegroup refractiveindexthatisnecessary to calculatetheabsolutethicknessvalue. As anexample, we show thespreading of a siliconeoilon a reference surface in real time.es_ES
dc.description.affiliationFil: Constantino, Santiago. Universidad Tecnológica Nacional. Facultad Regional Delta. Investigación, Ciencia y Tecnología. CENES. Grupo de Nanofotónica; Argentina.es_ES
dc.description.affiliationFil: Martínez, Oscar. Universidad Tecnológica Nacional. Facultad Regional Delta. Investigación, Ciencia y Tecnología. CENES. Grupo de Nanofotónica; Argentina.es_ES
dc.description.affiliationFil: Torga, Jorge Román. Universidad Tecnológica Nacional. Facultad Regional Delta. Investigación, Ciencia y Tecnología. CENES. Grupo de Nanofotónica; Argentina.es_ES
dc.description.peerreviewedPeer Reviewedes_ES
dc.formatapplication/pdfes_ES
dc.identifier.citationSantiago Costantino, Oscar E. Martínez, and Jorge R. Torga, "Wide band interferometryforthicknessmeasurement," Opt. Express 11, 952-957 (2003)es_ES
dc.identifier.doi10.1364/OE.11.000952
dc.identifier.urihttp://hdl.handle.net/20.500.12272/4474
dc.language.isoenges_ES
dc.relation.referenceshttps://www.osapublishing.org/oe/abstract.cfm?uri=oe-11-8-952es_ES
dc.rightsinfo:eu-repo/semantics/openAccesses_ES
dc.rights.holderCostantino, Santiagoes_ES
dc.rights.urihttp://creativecommons.org/licenses/by-nc-sa/4.0/*
dc.rights.uriAtribución-NoComercial-CompartirIgual 4.0 Internacional*
dc.rights.useAtribución–No Comercial–Compartir Igual (by-nc-sa)es_ES
dc.sourceinterferometryforthicknessmeasurement," Opt. Express 11, 952-957 (2003)es_ES
dc.subjectUTNes_ES
dc.subjectFacultad Regional Deltaes_ES
dc.subjectWide Band Interferometryes_ES
dc.subjectWhite-light Interferometryes_ES
dc.subjectThicknessmeasurementes_ES
dc.titleWide band interferometryforthicknessmeasurementes_ES
dc.typeinfo:eu-repo/semantics/articlees_ES
dc.type.versioninfo:eu-repo/semantics/publishedVersiones_ES

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