FRD - Investigación - Ciencia y Tecnología
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Item Limitations due to the detector in the low coherence interferometry(2008-02-15) Morel, Eneas Nicolás; Torga, Jorge RománSe describirá como se generan las señales de interferometria de baja coherencia en el espacio de Fourier, se determinara las características que determinan el rango dinámico del sistema y las señales asociadas al sistema de detección y su influencia en la señal de interferencia.Item Characterization of reference standards for dirt by Laser Ablation Induced Photoacoustics (LAIP)(2009-07-23) Orzi, D.J.O; Morel, Eneas Nicolás; Torga, Jorge Román; Ravigioni, A.N.; Bilmes, G.MMeasurements of surface cleanliness and dirt characterization are important problems in a wide range of processes in industry and production. Standard methods are in most cases cumber some laboratory procedures that must be performed out of the production lines. Instruments and methods for clean liness determination and dirt characterization require reference standards for calibration. For that purpose we built a possible dirt reference standard (DRS) made by films of graphite greases ubjected to heat treatment for mechanical stabilization. The DRS characterization was performed by Laser Ablation Induced Photoacoustics (LAIP). The measurement of the thickness of the films was made by low-coherence interferometry.Item Simple method for thickness measurement in opaque samples with a Michelson-Sagnac interferometer(2008-04-24) Morel, Eneas Nicolás; Torga, Jorge RománWe present in this work a method to measure thicknesses of opaque samples. The technique combines the use of low coherence interferometry with a Michelson-Sagnac configuration. This ring set-up let us to measure both faces of the sample simultaneously. So it is possible to obtain the thickness by measuring the optical path difference between a reference and both surfaces of the sample. Experimental results up to 1mm are shown in metal gauge block. A resolution better than 10 micronswas obtained.Item Simultaneous measurement of deformation and thickness change in polymer films(2006-08-14) Torga, Jorge Román; Morel, Eneas NicolásWe present experimental results in deformation measurement and thickness change in polymer films employing Fourier domain interferometry. The set-up is a Michelson configuration in which interference signal betweeen light reflected from a reference arm is superposed with two reflection from the first and second interface from the film sample. Distance measurements for determination of deformation and thickness values were obtained after an inverse Fourier transform of the spectrum signal. With this configuration, measurements with 1 micron axial resolution, and 2mm dynamic range were obtained